Virendra Singh, Ph.D(NAIST, Japan)
Contact Information:
E-mail: viren@serc.iisc.ernet.in, virendra@computer.org
Tel: +91-80- 2293 3421
(Direct), 2360 0654 (Extn - 212)
Fax: +91-80- 2360 2648
Postal Address:
Room No. - 212
Supercomputer Education and Research
Centre (SERC)
Indian Institute of Science (IISc)
Bangalore - 560 012, India
My
Calendar
New:
Requirement: Post Doctoral
Fellows/ Research Associates
Funding: DST-JST funding,
DST-RFBR
Papers: ATS papers, ICCD paper, VLSI-SOC paper, SOCC tutorial
Conferences: DRV`11, IWPVTD`11, WRTLT`11, ATS`11, RASDAT`12, Workshop in honour of Prof. Fujiwara
Courses: SE-286, E0-285
Publications
Teaching Funding Professional
Activities Students
Visitors RASDAT IWPVTD
Associated Lab.: Computer Design and Test Lab.
(CDTL)
Research Interest:
- VLSI Testing and Verification
- Processor architecture &
micro-architecture
- Fault-tolerant computing
- Robust design and architectures
- Self-healing system design
- SoC/NoC design and test
- Post Silicon Debug
- High level synthesis
- Formal verification
- Trusted computing
- FPGA based acceleration
- Trusted hardware design
Education:
- Ph.D (Computer Science) - (2002-2005)
Nara Institute of Science and Technology (NAIST)
Kansai Science City, Nara,
Japan
Advisor: Prof.
Hideo Fujiwara
Co-Advisors: Prof. Kewal K. Saluja (Univ. of Wisconsin-Madison, USA)
and Prof. Michiko Inoue (NAIST)
Thesis: Instruction-Based
Self-Testing of Performance Oriented Faults in Modern Processors
- M.E (Electronics & Communication) -
(1994-1996)
Malaviya National
Institute of Technology (MNIT)
Jaipur
(Rajasthan) India
Advisor: Prof. MS Gaur
- B.E (Hons) in
Electronics & Communication - (1990-1994)
Malaviya National
Institute of Technology (MNIT)
Jaipur
(Rajasthan)
Professional Experience:
Publications: List
of my publications
Recent
Publications:
In 2011
- Pramod Subramanyan, Virendra
Singh, Kewal Saluja,
and Erik Larsson, `Adaptive execution assistance for multiplexed
fault-tolerant chip multiprocessors`, 29th IEEE International
Conference on Computer Design (ICCD)
2011, Amherst, MA, USA, October 2011
- Mohammed
Abdul Razzaq, Virendra Singh, and Adit Singh, `SSTKR: Secure and testable scan design
through test key randomization`, 20th IEEE Asian Test Symposium
(ATS) 2011, New Delhi, India,
Nov. 2011
- Suraj Sindia, Vishwani Agrawal, and Virendra
Singh, `Test and diagnosis of analog circuits using moment generating
functions`, 20th IEEE Asian Test Symposium (ATS) 2011, New Delhi, India, Nov.
2011
- Manas Puthal, Virendra
Singh, MS Gaur and Vijay Laxmi, `C-Routing: An
adaptive hierarchical NoC routing methodology`,
19th IFIP/IEEE International Conference on Very Large Scale
Integration (VLSI-SoC) 2011, Hongkong,
China, October 2011
- Anzhela Matrosova, Virendra
Singh, Alexey Melnikov,
and Ruslan Mukhamedov,
`Selection of state variables for partially enhanced scan`, 9th
IEEE East-West Design and Test Symposium (EWDTS) 2011, Sevastopol,
Ukraine,
September 2011.
- Mohammad
Abdul Razzaq, Alok Baluni, Ram Rakesh Jangir, Virendra Singh, and Masahiro Fujita, `On
synthesis of degradation aware circuits at higher level of abstraction`, 9th
IEEE East-West Design and Test Symposium (EWDTS) 2011, Sevastopol, Ukraine, September 2011.
- Pawan Kumar and Virendra Singh, Efficient regular
expression pattern matching using cascaded automata architecture for
network intrusion detection system`, 9th IEEE East-West Design
and Test Symposium (EWDTS)
2011, Sevastopol, Ukraine, September 2011.
- V. Prasanth, Virendra Singh, and Rubin Parekhji, `Reduced overhead soft error mitigation
methodology using error control coding technique`, 17th IEEE
International On-Line Test Symposium (IOLTS)
2011, Athens, Greece, July 2011.
- Dimitar Nikolov, Urban Ingelsson, Virendra Singh, and Erik Larsson, `Level of
confidence evaluation and its usage for roll-back recovery and checkpoint
optimization`, Workshop on Dependable and Secure Nanocomputing
(WDSN) 2011, Hongkong, China, May 2011
- Vinutha Konandur, Virendra
Singh, MS Gaur, and Anzhela Matrosova,
`Fault Grading at Higher Level of Abstraction`, IEEE International
Workshop on Processor Verification, Test and Debug (IWPVTD) 2011, Trondheim, Norway,
May 2011
- A. Matrosova, S. Ostanin, A. Milnikov, and Virendra Singh, `Using AND-OR tree for
path delay faults`, IEEE
International Workshop on Processor Verification, Test and Debug (IWPVTD) 2011, Trondheim,
Norway, May 2011
- Dimitar Nikolov, Urban Ingelsson, Virendra Singh, and Erik Larsson, `Study on
level of confidence for rollback recovery with check-pointing`, Workshop on Dependability Issues in
Deep-submicron Technologies (DDT)
2011, Trondheim, Norway, May 2011
- Suraj Sindia, Vishwani Agrawal, and
Virendra Singh, `Nonlinear analog circuit test and diagnosis under process
variation using V-transform coefficients`, 29th IEEE VLSI Test
Symposium (VTS), 2011,
California, USA, May 2011
- Suraj Sindia, Vishwani Agrawal, and
Virendra Singh, `Testing linear and non-linear analog circuits using
moment generation functions`, 12th IEEE Latin American Test Workshop (LATW) 2011, Porto de Galinhas, Brazil, March 2011
- Chao Han, Adit Singh, and
Virendra Singh, `Efficient partially enhanced scan for high coverage delay
testing`, 2011 Joint IEEE International Conference on Industrial
Technology and 43rd Southeastern Symposium on System Theory (ICIT-SSST) 2011, Auburn, USA,
March 2011
- Suraj Sindia, Vishwani Agrawal, and
Virendra Singh, `Distinguishing process variation induced faults from
manufacturing defects in analog circuits using V-transform
coefficients`, 2011 Joint IEEE
International Conference on Industrial Technology and 43rd
Southeastern Symposium on System Theory (ICIT-SSST) 2011, Auburn, USA, March 2011
- Sudipta Sarkar, Anubhav Adak, Virendra
Singh, Kewal Saluja,
and Masahiro Fujita, `SEU tolerant SRAM cell`, International Symposium on
Quality Electronic Design (ISQED)
2011, Santa Clara, CA, USA, March 2011
- Naveen Choudhary, M.S. Gaur,
Vijay Laxmi, and Virendra Singh, `Traffic aware
topology generation methodology for application specific NoC`, IEEE International Symposium on Electronic
Design, Test and Application (DELTA)
2011, Queens Town, New Zealand, Jan 2011
- Navaneeth Rameshan, Mark Zwolinski, Vijay Laxmi, M.S.
Gaur, Virendra Singh, and Lalith P.,
`Acceleration of functional validation using GPGPU`, IEEE International
Symposium on Electronic Design, Test and Application (DELTA) 2011, Queens Town, New Zealand, Jan 2011
Selected Publications
(Before 2011):
- [Book Chapter] Dimitar Nikolov, Mikael Vayrynen, Urban Ingelson,
Virendra Singh, and Erik Larsson, `Optimizing Fault Tolerance for
Multi-Processor System-on-Chip`, Design
and Test Technology for Dependable Systems-on-Chip, Editors: Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus, 2010,
Hardcover, ISBN:978-1-6096-0212-3.
- Prasanth V., Virendra Singh, and
Rubin Parekhji, `Robust detection of soft errors
using delayed capture methodology`, IEEE International Online Testing
Symposium (IOLTS) 2010, Corfu, Greece,
July 2010
- Pramod Subramanyan,
Virendra Singh, Kewal K. Saluja,
and Erik Larsson, `Energy efficient fault tolerance in chip
multiprocessors using critical value forwarding`, 40th IEEE
International Conference on Dependable Systems and Networks (DSN), Chicago, IL, USA, June 2010.
- Naveen Choudhary,
MS Gaur, Vijay Laxmi, and Virendra Singh,
`Genetic algorithm based topology generation for application specific
network-on-chip`, IEEE International Symposium on Circuits and Systems (ISCAS) 2010, Paris, France,
May 2010.
- Raghavendra Adiga,
Arpit Gandhi, Virendra Singh, Kewal Saluja, and Adit Singh, `Modified T-FF bases scan cell for RAS`,
15th IEEE European Test Symposium (ETS) 2010, Prague, Czech Rep., May 2010.
- Jaynarayan Tudu,
Erik Larsson, Virendra Singh, and Hideo Fujiwara, `Scan cell reordering to
minimize peak power during test cycle: A graph theoretic approach`, 15th
IEEE European Test Symposium (ETS)
2010, Prague,
Czech Rep., May 2010.
- Pramod Subramanyam,
Virendra Singh, Kewal Saluja,
and Erik Larsson, `A low cost redundant execution architectures for Chip
multiprocessors`, Design Automation and Test in Europe (DATE) 2010, Dresden, Germany,
March 2010.
- Dimitar Nikolov,
Urban Ingelsson, Virendra Singh, and Erik
Larsson, `Estimating error probability and its application for optimizing
roll-back recovery with checkpointing`, IEEE
Symposium on Electronic Design, Test & Applications (DELTA) 2010, Ho Chi Minh , Vietnam, Jan 2010
- Suraj Sindia,
Virendra Singh, and Vishwani D. Agrawal, `Parametric Fault Diagnosis of Nonlinear
Analog Circuits using Polynomial Coefficients`, 23rd International
Conference on VLSI Design (ICVD)
2010, Bangalore, Jan 2010.
- Naveen Choudhary, MS
Gaur, Vijay Laxmi, and Virendra Singh,
`Designing Application Specific Irregular Topology for Network-on-Chip`,
17th International Conference on Advanced Computing and
Communications (ADCOM) 2009, Bangalore, Dec 2009.
- Suraj Sindia,
Virendra Singh, and Vishwani Agrawal,
`Multi-tone Testing of Linear and Nonlinear Analog Circuits using
Polynomial Coefficients`, IEEE Asian Test Symposium (ATS) 2009, Taichung, Taiwan, Nov
2009.
- Deepak K.G., Robinson Reyna,
Virendra Singh, and Adit Singh, `Leveraging
Partial Enhanced Scan for Improved Observabilty
in Delay Fault Testing`, IEEE Asian Test Symposium (ATS) 2009, Taichung, Taiwan, Nov
2009.
- Jaynarayan Tudu,
Erik Larsson, Virendra Singh, and Vishwani D. Agrawal, `On
Minimization of Peak Power during SoC Test`,
IEEE European Test Symposium (ETS)
2009, Seville, Spain, May 2009.
- Reshma Jumani,
Niraj Jain, Virendra Singh, and Kewal K. Saluja, `DX-Compactor: Distributed X-Compaction
for SoC Test`, ACM
Annual Great
Lake Symposium on VLSI (GLSVLSI) 2009, Boston, USA,
May 2009.
- Suraj Sindia,
Virendra Singh, and Vishwani Agrawal,
`Coefficient-Based Parametric
Testing of Non-Linear Analog Circuits`, ACM Annual Great Lake
Symposium on VLSI (GLSVLSI)
2009, Boston, USA, May 2009.
- Mikael Vayrynen,
Virendra Singh, and Erik Larsson, `Fault-Tolerant
Average Execution Time Optimization for General Purpose Multi-Processor
System-on-Chips`, Intl. Conference on Design Automation and Test in
Europe (DATE) 2009, Nice, France,
Apr 2009.
- Virendra Singh and Erik
Larsson, `On Reduction of Capture Power for Modular System-on-Chip Test`,
9th IEEE WRTLT 2008, pp. 35-40, Sapporo, Japan,
Nov 2008.
- Virendra Singh, Michiko
Inoue, Kewal K. Saluja,
and Hideo Fujiwara, `Instruction-Based Self-Testing of Delay Faults in
Pipelined Processors`, IEEE Trans. on VLSI Systems, Vol. 14, No.
11, Nov. 2006, pp. 1203-1215.
- Virendra Singh, Michiko
Inoue, Kewal K. Saluja,
and Hideo Fujiwara, `Program-Based Testing of Superscalar Microprocessor`,
Proceedings of the IEEE 14th North Atlantic Test Workshop,
May 2005, pp. 79-86, Berlington, VT, USA, May
2005.
- Virendra Singh, Michiko
Inoue, Kewal K. Saluja,
and Hideo Fujiwara, `Delay Fault Testing of Processor Cores in Functional
Mode`, IEICE Trans. on Information & Systems, Vol. E-88D, No.
3, March 2005, pp. 610-618.
Funding:
Project: Design of Self-healing System Chips
Funding: INR 72 Lakhs
- UK India Education and
Research Initiative (UKIERI) grant,
with Prof. MS Gaur, MNIT, Jaipur and Prof. Mark Zwolinski,
Southampton University,
UK - (2009
to 2011)
Project:
Multi-Processor Electronic Design Automation
Funding:
INR 22 Lakhs
- LSI Technology Research Grant (2009 to 2013)
Project: Techniques to Speedup
Loading of Scan Pattern
Funding: INR 40 Lakhs
(INR 10 Lakhs per year)
·
Research grant
under strategic Japanese-Indian
cooperative program (DST-JST) with Prof. Masahiro Fujita,
Tokyo University,
Tokyo, Japan (2010 - 2013)
Project: Computer aided design of hardware
accelerated Tsunami prediction system
Funding:
INR 1.6 Crores
- Indo Russian (DST-RFBR) joint
research grant with Prof. Anzhela Matrosova, Tomsk State
University (2011 -
2013)
Project:
Synthesis of high quality testable circuits and diagnosis of performance
oriented faults
Funding:
INR 20 Lakhs
- Indo Russian (DST-RFBR))
joint research grant with Lyudmila Babenko, Taganrog Institute
of Rechnology, and Prof. M.S. Gaur, MNIT, Jaipur
(2011 - 2013)
Project:
Development of techniques for metamorphic malware
detection and analysis
Teaching:
Current Semester (Aug -
Dec 2011)
Recent Past
- MEL-G626: VLSI Testing and Testability (at BITS, Pilani,
Aug-Dec 2006)
(VLSI
Testing and Formal Verification)
Other Activities/ Courses:
- Co-coordinator, IEP on VLSI Testing & Verification at IISc.
(Mar 10-19, 2008)
Professional Activities
Convener, Computer Design
and Test Lab., SERC, IISc
Member, Departmental
Curriculum Committee (DCC), SERC, IISc
Steering Committee member
- IEEE Intl. Workshop on Reliability Aware
System Design and Test (RASDAT)
- IEEE Asian Test Symposium (ATS)
- IEEE Workshop on RTL and High Level Testing
(WRTLT)
General Co-Chair - RASDAT (2010, 2011,
2012)
Program Co-Chair - WRTLT
2011
Finance Chair - ATS 2011
Program Co-Chair - DRV
2011
General Co-Chair - IWPVTD 2011
Technical Program
Committee Member
- IEEE International Conference on Computer
Design (ICCD) - 2011 (Processor architecture track)
- IEEE Asia Pacific Design Automation
- IEEE International Symposium on VLSI (ISVLSI)
- 2011
(Chennai)
- IEEE/IFIP International Symposium on Very Large
Scale Integration (VLSI-SoC) - 2011 (Hong
Kong)
- Design
Automation and Test in Europe (DATE) - 2009 (Nice), 2010 (Dresden)
- Intl.
Conference on VLSI Design - 2010 (Student track
chair), 2011 (Test Track Chair), 2012 (TV track chair)
- VLSI Design
and Test Symposium (VDAT) - 2009 (Bangalore), 2010 (Chandigarh)
- IEEE Workshop on RTL and High Level Testing
(WRTLT) - 2009
(Hong Kong), 2010 (Shanghai)
- Intl. Conference on Risk and Security of
Internet and Systems (CRiSIS) - 2009 (Toulouse)
- Intl. Conf. on Advanced Computing and
Communication (ADCOM) - 2009
(track chair)
- Intl. Workshop on Network on Chip
Architectures (NoCArc) - 2009 (New York)
- Intl. Conf. on Emerging Trends in Engineering
and Technology (ICETET) - 2009
- IEEE Workshop on Design Reliability and
Variability (DRV) - 2009 (Austin,
USA)
- IEEE North Atlantic Test Workshop (NATW) -
2010 (New York)
Current Students:
Collaborators
Visitors
Photos